By Paul R. Gray, Paul J. Hurst, Stephen H. Lewis, Robert G. Meyer
This is often the single complete e-book out there for engineers that covers the layout of CMOS and bipolar analog built-in circuits. The 5th variation keeps its completeness and updates the insurance of bipolar and CMOS circuits. a radical research of a brand new low-voltage bipolar operational amplifier has been extra to Chapters 6, 7, nine, and eleven. bankruptcy 12 has been up-to-date to incorporate a completely differential folded cascode operational amplifier instance. With its streamlined and up to date insurance, extra engineers will flip to this source to discover key ideas within the box.
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Extra info for Analysis and Design of Analog Integrated Circuits, 5th edition
57, 78–88 (2006) 52. : Electrochem. Solid State Lett. 10, C27–C30 (2007) 53. : Electrochim. Acta 52, 5159–5171 (2007) 54. : Annu. Rev. Mater. Sci. 27, 469–498 (1997) 55. : Lehrbuch der physikalischen Chemie. Wiley VCH, Weinheim (2004) 56. : Physikalische Chemie. Wiley VCH, Weinheim (2001) 57. : Elektrochemie. Wiley VCH, Weinheim (1998) 58. : Grundlagen der Elektrochemie. Vieweg, Braunschweig (1996) 59. : Combined spectroscopic and electrochemical studies of ion transport and corrosive de-adhesion processes at polymer/oxide/metal interfaces.
12c). After 22 h of exposure to humid air, the electrolyte front is located at approximately x = 4,900 lm on iron and approximately x = 1,200 lm on the iron/zinc sample, which in fact refers to an effective transport distance of not more than 800 lm along the epoxy coated zinc interface . Several conclusions about interfacial ion transport mechanisms can be drawn based on the data presented in Fig. 12 and on additional measurements reported in literature: • Ion transport at polymer coated iron, steel, zinc or copper samples proceeds at a relevant rate if the potential of the intact polymer/oxide/metal interface is higher than the defect potential [60, 66, 67].
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Analysis and Design of Analog Integrated Circuits, 5th edition by Paul R. Gray, Paul J. Hurst, Stephen H. Lewis, Robert G. Meyer